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Semiconductor Test
Tecap SPACE offers all the functions necessary to control test systems (ATE) for the semiconductor test. Tecap is hardware-independent and can be used with all customer-specific concepts.
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Jandel Test Unit
ResTest
The new Jandel ResTest Test Unit is a constant current source and digital voltmeter with large colour screen, supplying constant currents between 1uA and 10mA, and measuring voltages from 0.04mV to 4000mV.
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Automatic AC High Voltage Test Set
Used in testing of air conditioners, this is available to clients in different specifications.
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SMD LED Aging Test Machine
CX-6100
Shenzhen Chuangxin Instruments Co., Ltd.
Designed to measure the aging-life and color comparisons of 50pcs 5050 SMD LED and 100pcs 3528 SMD LED.• 150 separate constant current supply• Aging functions: constant current, impact pulse, on-off mode• Range of forward voltage(VF): 5.0V• Range of forward current(IF):1) constant current: 0-100.0mA2) Impact pulse: 0-200.0mA• Range of impact pulse frequency: 10-9999Hz; Duty ratio: 1%-99%
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Gas Chromatograph Test
Guangzhou Biaoji Packaging Equipment Co., Ltd.
Gas Chromatograph test the smell and solvent residues of printed packaging materials and test the quality and purity of the solvent.
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CAM/TRAC Test Kits
Series 41
The Series 41 dual well mechanical kits provide a test solution where Z axis and the testing of two PCA’s is required. These can be similar devices, or devices that are used together in a functional test. The Series 41 Kits have the same available features and options as the Series 40 Kits. (Limited sizes available.)
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VNA Microwave/RF Cable Test Assemblies
VNA Microwave/RF Test Assemblies set the industry standard for vector network analyzers (VNAs) through 70 GHz. Constant and/or highly repetitive movement of cables can compromise the measurement precision of high-performance VNAs. Leading manufacturers choose GORE® VNA Microwave/RF Test Assemblies because of the improved performance they see in their equipment.
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Economical Solution for Test Requiring Fewer Instrumentation Modules.
OPTOWARE-S200 (FOTS-Bench Top Series)
•LD Driver, EDFA, ASE Broadband Source, 1X4 Optical Switch•Variable Optical Attenuator, Wavelength Meter•SOA Driver, SLED Driver, Pump LD Driver•Pattern Generator & BERT, SFP Transceiver Driver•4Channel Optical Return Loss Meter (Light Source & Power Meter)
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CRPA Test System
The Spirent CRPA Test System is a development of Spirent’s GSS9000 Series platform for testing Controlled Reception Pattern Antenna (CRPA) systems with a separate RF output per antenna element. The CRPA Test System generates both GNSS and interference signals. Users can control multiple antenna elements. Null-steering and space/time adaptive CRPA testing are both supported by this comprehensive wavefront approach.
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Small-fiber Test
Q-Sense
Q-Sense offers a scientifically validated measure of warm, cooland heat-pain thermal sensory thresholds, all clinically usefuldeterminants in the evaluation of neuropathic pain, diabeticneuropathy, chemotherapeutic and other small-fiber neuropathies.
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Test Analysis for Land Seismic Systems
Testif-i Land
Testif-i Land is an independent, powerful and cost effective software suite that allows you independently process instruments, source and receiver tests to confirm that the equipment is performing correctly and within specification. The software includes modules to perform comprehensive analysis of vibrator wireline similarity test data. Analysis includes a harmonic intensity plot which can highlight problems such as sub-harmonics which may not be seen on numerical results. Geophone pulse tests can be analysed using the receiver response module and test data from third party geophone testers can be graphed and statistics produced for ease of interpretation.
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Temperature Humidity Test Chamber
Dongguan Kejian Instrument Co., Ltd.
This equipment can simulate different environment condition. It's appropriate for testing material performance, such as resist heat, resist dry,resist humidity and resist cold. That can define performance of material.
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USB-C® Short Channel Rx Precet. Test Fixture
AUT20098
*Easy swap between CC1 and CC2RP & RD Mode: In the older version of the USB-C full breakout board, users had to manually set the jumper with a short pin. But now users can easily swap between the two by just moving the switch.*In the previous version, the soldering joint of Test Fixture Host Fixture 1A gets worn out quickly from repetitive plug and pull. This newly designed fixture is more durable and users can easily replace the worn out SMA connectors with new ones.*DC-in Jack is upgraded to +5V USB C portA boost in user experience as it makes setting up easier.
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Test Leads
AL-34WB 10A
Standard Electric Works Co., Ltd
● Wire length: 1m approx. Silicone insulated wire (700mm) with wire connected to straight input plugs (150mm PVC wire), and wire for clamp (150mm PVC wire).● Outside diameter of silicone insulated wire: 6.4mm Outside diameter of PVC wire: 4mm● Input plug color: Red•Green•Black•Blue ● Current rating: 10A● Voltage rating: 300V● Designed for Milliohm meter, Micro-ohm meter, Low resistance measurement with high current injection. ● Conductor size: 40mm maximum● Safety standard: IEC/EN 61010-031 CAT IV 300V
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Fully Automatic Eddy Current Crack Test System
ROTO-SCAN
Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
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JTAG External Modules (JEM) DIMM/SODIMM Socket Cluster Test
The primary function of the JTAG External Modules (JEM) for the DIMM/SODIMM Socket Cluster Test is to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system and to strengthen the memory-independent JTAG testing for the assembly correctness of the almost full spectrum of the modern socket types, particularly (according to JEDEC_Std.21-C):
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RJ-11, RJ-12, RJ-14 Test Connectors
Test connector (6 pole) for contacting RJ-11 interfaces. Applications in data networks, data transmission, power supplies, microphones, etc.
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BARE BOARD TEST PROBES
Probe Technical DataMechanicalMINIMUM CENTERS: .100 (2.54)FULL TRAVEL: .160 (4.06)WORKING TRAVEL: .107 (2.72)OPERATING LIFE: 1,000,000 cyclesElectricalMAXIMUM CURRENT: 5 amps continuousat working travel, non-inductiveRESISTANCE: At 35 mA test current60 18 mOHMS mean63 60 mOHMS meanMaterials and FinishesPLUNGER: Heat treated beryllium copper60 24 Kt gold plated over nickel63 24 Kt gold plated over nickelBARREL: Nickel silver60 24 Kt gold plated ID and OD over nickel63 No FinishSPRING: Music Wire, 24 Kt gold platedover nickel
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AFDX ® /ARINC664P7 Networks Test, Simulation, Monitoring & Analyzer
ACE-FDX-3U-2
AFDX®/ARINC664P7 Test and Simulation module for PCIe x1 with 2 full duplex ports programmable for 10/100/1000 MBit/s. Versions available for both Airbus and Boeing variants of ARINC664P7. Test, verification and simulation of AFDX®/ARINC664P7 End Systems, Switches and Networks. Support for Single or Redundant AFDX®/ARINC664P7 operation. Support for Boeing ARINC664 extensions for EDE at the hardware interface layer.
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VCORE Power Test
To support the heavy computing loads required by AI technologies, system servers must rely on high performance CPUs and GPUs capable of complex, real-time processing. These processors are powered by VCORE power supplies, embedded DC/DC converters, or voltage regulator modules (VRMs).
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Accelerated Stress Test Chamber
CSZ's accelerated stress test chambers combine mechanical refrigeration; LN2 cooling and high velocity air flow for fast product temperature change rates. Chambers are typically designed with a change rate up to 30C (54F) per minute based upon the part temperature. Common uses are production stress testing circuit boards, electronic drives, assemblies, etc. Design allows the user to quickly control and change the temperature of the product.
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880 Video Test Generators and Analyzers
880 Series
The Teledyne LeCroy quantumdata 880 series video test instruments offer a wide variety of solutions for HDMI 1.3, DVI, DisplayPort 1.1 and analog video. There are several options (models) available depending on the digital interfaces and functions that are required for a particular application. The solutions supported by the 880 series include functional testing in the R&D environment, compliance testing, manufacturing testing for production lines and testing in military applications as well.
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Test Automation Platform (TAP)
The Keysight Test Automation Platform (TAP) provides powerful, flexible and extensible test sequence and test plan creation with additional capabilities that optimize your test software development and overall performance. TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher level test executive software environments.
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Relay Test Set and Universal Calibrator
CMC 256plus
The CMC 256plus is the first choice for applications requiring very high accuracy. This unit is not only an excellent test set for protection devices of all kinds but also a universal calibrator.
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Ball Pressure Test
Premier Electrosystems' Ball Pressure Test is used to determine dimensional stability under stress at elevated temperatures. It analyses the relationship between the degree of deformation and the temperature when the test specimen is subjected to a constant load.
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MIPI Receiver Test Solution
M8085A
The M8085A is a software plug-in for M8070A Bit Error Ratio Test system software within the M8000 series of BER test solutions. The M8085A software plug-in controls either the M8190A or the M8195A Arbitrary Waveform Generators to create C-PHY or D-PHY standard compliant test signals. In addition it provides routines for calibration of all signal parameters and for all tests specified in the applicable Conformance Test Suite. Together with the additional available DUT control interface it is possible to read the BER of the receiver under test from the M8070A software and display the BER dependency from test parameters within the M8070A user interface.
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VLF Hipot Test Set
HTDP-H
Wuhan Huatian Electric Power Automation Co., Ltd.
Suitable for voltage test items of electrical equipment with large insulation equivalent capacitance.
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Antenna Test System
ATS1000
Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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High Voltage Test & Measurement System
Hard-wearing and technically-sound High Voltage Test & Measurement System is developed to provide accurate results. These systems are widely used in power, electrical, engineering and other industries. They are designed using heavy-duty spare-parts to add strength with life to the systems. They are ideal to provide accurate results without any flaw to ensure to provide the best performance. These systems are perfect combination of easy usage, durability and high accuracy in results.
